i01 - Establishing a metrological underpinning for monitoring radioactivity with uncrewed aerial vehicles

i02 - Thermometry with embedded SI traceability for industrial applications 2

i03 - Nanoscale metrology for advanced semiconductor manufacturing

i04 - Critical metrology for advanced 3D semiconductor architectures

i05 - Traceable EUV/VUV metrology for evolving optical properties of novel materials

i06 - Metrology for wideband testing in the high-voltage and power electronics industry

i07 - Metrology support for the Iron Power Cycle: A clean and circular solution for energy storage and utilisation

i08 - Unlocking the circular battery economy: Metrology for advanced recycling, black mass characterisation, and purification of minerals

i09 - Fibre-optic thermometry for a clean and competitive industry

i10 - From waste to resource without plastic pollution: Metrology for micro- and nanoplastics in water reuse and biowaste valorisation

i11 - Metrology for efficient EV powertrain transmissions

i12 - Functional metrology for advanced nanomaterials

i13 - Metrology for performance and efficiency metrics of electrolytic hydrogen production

i14 - Artificial Intelligence for traceable metrological computed tomography in advanced manufacturing

i15 - Grid waveform metrology for transient characterisation and harmonisation

i16 - High throughput analysis of (nano-enabled) advanced materials in industrial workflows 

i17 - Metrology of surface texture of ultrasmooth surfaces with sub-10 pm accuracy

i18 - Metrology for monitoring, diagnostics, and reliability of high-capacity HVAC and HVDC cable systems

i19 - Next generation high-stability laser sources for precision engineering and industry

i20 - Traceable optical surface texture metrology for complex and additively manufactured surfaces